DocumentCode :
1534167
Title :
Novel integrated photodetector on Si LSI circuits. Optically controlled MOSFET
Author :
Shimomura, Kazuhiko ; Yamagata, Tomonari
Author_Institution :
Dept. of Electr. & Electron. Eng., Sophia Univ., Tokyo, Japan
Volume :
5
Issue :
2
fYear :
1999
Firstpage :
178
Lastpage :
183
Abstract :
We have demonstrated a novel integrated photo-detector on Si large-scale integration circuits. This device integrated the light absorption region on the gate of metal-oxide-semiconductor field-effect transistor (MOSFET), and the long wavelength light controls the current of MOSFET. The GaInAs-InP multiple-quantum-well absorption region and SiO2 of the MOSFET were directly bonded. From the experimental results, we confirmed that the light-controlled current was increased by shortening the gate length of the MOSFET, and that an 1850 A/W responsivity was obtained in a 3.5-μm gate length device using an irradiation of 1.5-μm wavelength light
Keywords :
III-V semiconductors; MOSFET circuits; gallium arsenide; indium compounds; integrated optoelectronics; large scale integration; optical interconnections; photodetectors; semiconductor quantum wells; 1.5 mum; 3.5 mum; GaInAs-InP; GaInAs-InP multiple-quantum-well absorption region; MOSFET; MOSFET gate; Si; Si LSI circuits; Si large-scale integration circuits; SiO2; gate length; gate length device; integrated photodetector; light absorption region; light-controlled current; long wavelength light control; metal-oxide-semiconductor field-effect transistor; optically controlled MOSFET; Absorption; FETs; Integrated circuit interconnections; Large scale integration; MOSFET circuits; Optical attenuators; Optical control; Optical devices; Optical interconnections; Photodetectors;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/2944.778279
Filename :
778279
Link To Document :
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