• DocumentCode
    1534525
  • Title

    Thermal behavior of BAW filters at high RF power levels

  • Author

    Wunnicke, Olaf ; Van der Wel, Paul J. ; Strijbos, Remco C. ; De Bruijn, Frank

  • Author_Institution
    Innovation & Technol., NXP Semicond., Eindhoven, Netherlands
  • Volume
    56
  • Issue
    12
  • fYear
    2009
  • fDate
    12/1/2009 12:00:00 AM
  • Firstpage
    2686
  • Lastpage
    2692
  • Abstract
    The temperature increase of bulk acoustic wave filters at high RF power levels has been investigated. Self-heating due to power dissipation in the filter leads to a nonuniform frequency shift of the insertion loss. At the right filter skirt, self-heating is amplified by the negative temperature coefficient of frequency. We demonstrate that at high RF power levels, this can cause thermal instabilities resulting in an abrupt step in the insertion loss. A novel frequency transformation is introduced to describe the nonuniform frequency shift of the insertion loss as well as the thermal instabilities. A condition for the occurrence of thermal instabilities is derived. It is argued that because of this nonuniform frequency shift at high power levels, accelerated lifetime tests can overestimate the lifetime, if the stress frequency is not compensated for self-heating. Here, the frequency transformation is used to determine the stress frequencies at high RF power levels from low-power S-parameter measurements.
  • Keywords
    S-parameters; UHF filters; acoustic filters; bulk acoustic wave devices; life testing; BAW filters; accelerated lifetime tests; bulk acoustic wave filters; frequency transformation; high RF power levels; insertion loss; low-power S-parameter measurements; negative temperature coefficient of frequency; nonuniform frequency shift; power dissipation; self-heating; stress frequencies; thermal instabilities; Acoustic waves; Filters; Insertion loss; Life estimation; Lifetime estimation; Power dissipation; Radio frequency; Scattering parameters; Temperature; Thermal stresses; Acoustics; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Micro-Electrical-Mechanical Systems; Radio Waves; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Temperature;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2009.1359
  • Filename
    5307500