• DocumentCode
    1534771
  • Title

    Ray tracing technique and its verification for the analysis of highly multimode optical waveguides with rough surfaces

  • Author

    Bierhoff, Thomas ; Wallrabenstein, Amir ; Himmler, Andreas ; Griese, Elmar ; Mrozynski, Gerd

  • Author_Institution
    R&D Inst., Paderborn Univ., Germany
  • Volume
    37
  • Issue
    5
  • fYear
    2001
  • fDate
    9/1/2001 12:00:00 AM
  • Firstpage
    3307
  • Lastpage
    3310
  • Abstract
    A novel hybrid ray tracing technique for the analysis of signal propagation in highly multimode optical waveguides with rough surfaces and its verification in part is presented. The technique combines geometrical optics with a light scattering model, based on wave optics by applying a Monte Carlo method. While the light scattering model takes mode coupling caused by surface irregularities into account, the ray tracing technique provides the analysis of light propagation in highly multimode waveguides with arbitrary shapes. The verification is obtained by calculating wave propagation within a slab waveguide with rough surfaces applying the well known coupled power theory, which provides the power of the guided modes versus the axial coordinate of the waveguide. Therefore, the ray tracing results are transformed into the discrete waveguide modes in order to compare the results
  • Keywords
    Monte Carlo methods; light scattering; optical waveguide theory; ray tracing; Monte Carlo method; arbitrary shapes; coupled power theory; discrete waveguide modes; geometrical optics; highly multimode optical waveguides; light scattering model; ray tracing technique; rough surfaces; signal propagation; slab waveguide; surface irregularities; wave optics; wave propagation; Geometrical optics; Light scattering; Optical propagation; Optical scattering; Optical surface waves; Optical waveguides; Ray tracing; Rough surfaces; Surface roughness; Surface waves;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.952601
  • Filename
    952601