• DocumentCode
    1534998
  • Title

    Adaptive error control for nanometer scale network-on-chip links

  • Author

    Yu, Qian ; Ampadu, Paul

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA
  • Volume
    3
  • Issue
    6
  • fYear
    2009
  • fDate
    11/1/2009 12:00:00 AM
  • Firstpage
    643
  • Lastpage
    659
  • Abstract
    The authors present an adaptive error control method for switch-to-switch links in nanoscale networks-on-chip to manage reliability, throughput and energy. Unlike previous works, the proposed method adjusts both error detection and correction simultaneously at runtime. For a given application or predicted noise scenario, an appropriate error control scheme is selected for reliable message transmission. When link conditions degrade, more powerful error detection and correction are temporarily provided to recover the previous message. To achieve this adaptation, the authors create a configurable M-error correction, 2M-error detection code, combined with a hybrid automatic repeat request retransmission policy. Simulation results show that the proposed method can reduce residual flit error rate by over three orders of magnitude and achieve up to 75% higher average throughput compared to other error control methods. Further, average energy per successfully transmitted flit is reduced by up to 15% compared to fixed error control in a 65-nm technology. Compared to a recent adaptive error detection method, a 34% energy reduction can be achieved in high noise environment, at the expense of moderate area overhead.
  • Keywords
    automatic repeat request; error correction codes; error detection codes; nanoelectronics; network-on-chip; 2M-error detection code; M-error correction; adaptive error control; hybrid automatic repeat request retransmission policy; nanometer scale network-on-chip links; switch-to-switch links;
  • fLanguage
    English
  • Journal_Title
    Computers & Digital Techniques, IET
  • Publisher
    iet
  • ISSN
    1751-8601
  • Type

    jour

  • DOI
    10.1049/iet-cdt.2008.0132
  • Filename
    5308008