Title :
Fault sampling revisited
Author :
Agrawal, Vishwani D.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
Abstract :
In the text, Test Generation for VLSI Chips (see IEEE Computer Society Press, 1988), V. Agrawal and S. Seth gave a formula for estimating fault coverage from the coverage analysis of randomly sampled faults that contains an error. A corrected formula for the sample size required for a given error tolerance in the measurement of fault coverage is given. Easy-to-use guidelines for analyzing fault coverage are presented.<>
Keywords :
VLSI; fault location; integrated circuit testing; Test Generation; VLSI Chips; coverage analysis; error; fault coverage; randomly sampled faults; sample size; Circuit faults; Equations; Error correction; Fault detection; Fluctuations; Monte Carlo methods; Random number generation; Sampling methods; Testing; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
