Dynamic statistical control of manufacturing test

Author

Ghosh, Sakti P. ; Grochowski, Edward G.

Author_Institution

IBM Almaden Res. Center, San Jose, CA, USA

Volume

7

Issue

4

fYear

1990

Firstpage

39

Lastpage

51

Abstract

A method for controlling manufacturing tests in real time by statistically predicting test behavior is described. This statistical prediction is used to eliminate certain tests in sequential testing. Analytic methods for clustering tests for more efficient execution and an algorithm for predictive testing are presented. A relational database using structured-query-language system, called SQL/DB2 is proposed; its structure allows efficient retrieval of the information needed for test prediction, test clustering, and predictive testing. A test-system architecture based on personal computers is presented.<>

Keywords

manufacturing computer control; manufacturing data processing; relational databases; SQL/DB2; dynamic statistical control; manufacturing test; predictive testing; real time; relational database; structured-query-language system; test behavior; test-system architecture; Algorithm design and analysis; Clustering algorithms; Computer architecture; Information retrieval; Manufacturing; Microcomputers; Prediction algorithms; Relational databases; Sequential analysis; System testing;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/54.57913

Filename

57913