Title :
Dynamic statistical control of manufacturing test
Author :
Ghosh, Sakti P. ; Grochowski, Edward G.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Abstract :
A method for controlling manufacturing tests in real time by statistically predicting test behavior is described. This statistical prediction is used to eliminate certain tests in sequential testing. Analytic methods for clustering tests for more efficient execution and an algorithm for predictive testing are presented. A relational database using structured-query-language system, called SQL/DB2 is proposed; its structure allows efficient retrieval of the information needed for test prediction, test clustering, and predictive testing. A test-system architecture based on personal computers is presented.<>
Keywords :
manufacturing computer control; manufacturing data processing; relational databases; SQL/DB2; dynamic statistical control; manufacturing test; predictive testing; real time; relational database; structured-query-language system; test behavior; test-system architecture; Algorithm design and analysis; Clustering algorithms; Computer architecture; Information retrieval; Manufacturing; Microcomputers; Prediction algorithms; Relational databases; Sequential analysis; System testing;
Journal_Title :
Design & Test of Computers, IEEE
