Title :
Giant magnetoresistance-based eddy-current sensor
Author :
Dogaru, Teodor ; Smith, Stuart T.
Author_Institution :
Dept. of Electr. Eng., North Carolina Univ., Charlotte, NC, USA
fDate :
9/1/2001 12:00:00 AM
Abstract :
The purpose of this paper is to introduce a new eddy-current testing technique for surface or near-surface defect detection in nonmagnetic metals using giant magnetoresistive (GMR) sensors. It is shown that GMR-based eddy-current probes are able to accurately detect short surface-breaking cracks in conductive materials. The self-rectifying property of the GMR sensor used in this study leads to a simplified signal conditioning circuit, which can be fully integrated on a silicon chip with the GMR sensor. The ability to manufacture probes having small dimensions and high sensitivity (220 mV/mT) to low magnetic fields over a broad frequency range (from dc up to 1 MHz) enhances the spatial resolution of such an eddy-current testing probe. Experimental results obtained by scanning two different probes over a slotted aluminum specimen are presented. General performance characteristics are demonstrated by measurements of surface and subsurface defects of different sizes and geometries. Dependence of the sensor output on orientation, liftoff distance, and excitation intensity is also investigated
Keywords :
aluminium; bridge circuits; coils; crack detection; eddy current testing; giant magnetoresistance; magnetic sensors; magnetoresistive devices; Al; Wheatstone bridge; broad frequency range; coil; conductive materials; eddy-current probes; eddy-current testing; excitation intensity; giant magnetoresistive sensors; high sensitivity; liftoff distance; low magnetic fields; near-surface defect detection; nonmagnetic metals; orientation dependence; self-rectifying property; short surface-breaking cracks; simplified signal conditioning circuit; slotted aluminum specimen; spatial resolution; surface defect detection; Circuits; Conducting materials; Giant magnetoresistance; Magnetic field measurement; Magnetic materials; Magnetic sensors; Probes; Silicon; Surface cracks; Testing;
Journal_Title :
Magnetics, IEEE Transactions on