DocumentCode
1535798
Title
Magnetoresistive read heads for high-density data applications
Author
Cuntze, Georg ; Hughes, Timothy ; Magnusson, Steven ; Nichtl-Pecher, Wolfgang ; Norton, David ; Pechtold, Michael
Author_Institution
Exabyte Magnetics GmbH, Nuremberg, Germany
Volume
37
Issue
5
fYear
2001
fDate
9/1/2001 12:00:00 AM
Firstpage
3839
Lastpage
3843
Abstract
We present experimental results such as channel response, signal-to-noise ratio, bit-error rate, and wear of anisotropic magnetoresistive (AMR) helical scan read heads compared to respective values of inductive ferrite read heads. The presented measurements indicate the advantages of the AMR head
Keywords
magnetic heads; magnetic recording noise; magnetic tape equipment; magnetoresistive devices; wear; anisotropic magnetoresistive heads; bit-error rate; channel response; helical scan read heads; high-density data applications; magnetoresistive read heads; noise response; signal-to-noise ratio; tape storage; wear; Anisotropic magnetoresistance; Azimuth; Bit error rate; Circuit testing; Ferrites; Magnetic force microscopy; Magnetic heads; Signal to noise ratio; System testing; Transducers;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.952755
Filename
952755
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