Title :
Effect of enhanced current crowding in a CPW with a thin ferroelectric film
Author :
Carlsson, E. ; Gevorgian, S.
Author_Institution :
Dept. of Microwave Technol., Chalmers Univ. of Technol., Goteborg, Sweden
fDate :
1/16/1997 12:00:00 AM
Abstract :
Enhanced current crowding is predicted at the edges of the conducting strips in thin ferroelectric film coplanar waveguides (CPWs). A minimum current crowding depth is expected, which depends on the CPW geometry and dielectric constant of the ferroelectric film. In practical CPW devices the enhanced current crowding can increase the conductor losses by up to four times. The current crowding depth may be smaller than the skin depth or London penetration depth (for high temperature superconducting CPW)
Keywords :
coplanar waveguides; current distribution; electric fields; ferroelectric thin films; losses; microwave devices; permittivity; waveguide theory; CPW devices; CPW geometry; conductor losses; current crowding depth; current crowding enhancement; dielectric constant; thin ferroelectric film;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19970103