DocumentCode
1535925
Title
Extraction of thermal time constant in HBTs using small signal measurements
Author
Bruce, S ; Trasser, A. ; Birk, M. ; Rydberg, A. ; Schumacher, H.
Author_Institution
Uppsala Univ., Sweden
Volume
33
Issue
2
fYear
1997
fDate
1/16/1997 12:00:00 AM
Firstpage
165
Lastpage
167
Abstract
A novel method for finding the thermal time constant of HBTs is proposed. It utilises small signal measurements in the frequency domain of the typical negative differential resistance found in the active region, i.e. normal bias conditions for the device. In this way, nonlinearities in the thermal resistivity do not disturb the extraction and the device needs only to be characterised at one bias point
Keywords
heterojunction bipolar transistors; negative resistance; thermal resistance; HBT; frequency domain; negative differential resistance; small signal measurement; thermal resistivity; thermal time constant;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19970102
Filename
579527
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