DocumentCode :
1535970
Title :
Predicting Let-Through Arc-Flash Energy for Current-Limiting Circuit Breakers
Author :
Papallo, Tom ; Valdes, Marcelo ; Roscoe, George
Author_Institution :
GE Consumer & Ind., Plainville, CT, USA
Volume :
46
Issue :
5
fYear :
2010
Firstpage :
1820
Lastpage :
1826
Abstract :
IEEE 1584, “Guide for Performing Arc-Flash Incident Energy Calculations,” provides a method to conservatively predict the incident energy let-through by over-current devices based on the device´s time-current curve or tested transfer functions. Additional testing by various manufacturers has shown that current-limiting (CL) circuit breakers (CBs) operating in their instantaneous CL range perform significantly better than what the IEEE 1584 Time-Current Curve-based model predicts. The authors will present an analytical method to estimate the incident energy from published CB let-through curves. The method will provide a conservative, yet better, estimate of the actual performance when compared to test data. This method can be used as a part of hazard risk planning rather than the Time-Current Curve method described in IEEE 1584 or when the manufacturer does not provide an incident-energy transfer function based on tests.
Keywords :
IEEE standards; arcs (electric); circuit breakers; current limiters; hazards; transfer functions; IEEE 1584; arc-flash incident energy calculations; current-limiting circuit breakers; hazard risk planning; incident-energy transfer function; let-through arc-flash energy; over-current devices; tested transfer functions; time-current curve-based model predicts; Circuit breakers; Circuit faults; Circuit testing; Current limiters; Equations; IEEE members; Performance evaluation; Thermal force; Transfer functions; Wood industry; Arc flash; IEEE 1584; circuit-breaker let-through curves; current-limiting circuit breaker; hazard risk planning; instantaneous current limiting;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/TIA.2010.2058084
Filename :
5510135
Link To Document :
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