Title :
Economics of built-in self-test
Author :
Ungar, Louis Y. ; Ambler, Tony
Abstract :
Using built-in self-test at the right level offers users significant cost savings, but determining which level, if any, is best for BIST can be complex. A detailed economic analysis can unravel heterogeneous costs and benefits so that designers and managers can make the right decision
Keywords :
built-in self test; integrated circuit economics; BIST; built-in self-test; cost savings; economic analysis; heterogeneous costs; Automatic testing; Built-in self-test; Circuit testing; Computer aided manufacturing; Cost benefit analysis; Design for testability; Fault detection; Fault diagnosis; Test equipment; Time to market;
Journal_Title :
Design & Test of Computers, IEEE
