• DocumentCode
    1536413
  • Title

    Test resource partitioning for SOCs

  • Author

    Chandra, Anshuman ; Chakrabarty, Krishnendu

  • Author_Institution
    Duke Univ., Durham, NC, USA
  • Volume
    18
  • Issue
    5
  • fYear
    2001
  • Firstpage
    80
  • Lastpage
    91
  • Abstract
    A new test-resource-partitioning approach, based on test data compression and on-chip decompression, reduces data volume, decreases testing time, and accommodates slower (less expensive) testers without decreasing test duality
  • Keywords
    logic testing; microprocessor chips; SOCs; test data compression; test duality; test-resource-partitioning; testers; testing time; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit testing; Compaction; Decoding; Hardware; Logic testing; Random access memory; Test data compression;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.953275
  • Filename
    953275
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1536413