DocumentCode :
1536422
Title :
Use of local measurements to estimate voltage-stability margin
Author :
Vu, Khoi ; Begovic, Miroslav M. ; Novosel, Damir ; Saha, Murari Mohan
Author_Institution :
ABB Trans. Tech. Inst., Raleigh, NC, USA
Volume :
14
Issue :
3
fYear :
1999
fDate :
8/1/1999 12:00:00 AM
Firstpage :
1029
Lastpage :
1035
Abstract :
Estimating the proximity of power systems to voltage collapse in real time still faces difficulties. Beside the data management and computational issues, any central control method is subject to the reliability of long-distance data communications. In the paper, the authors describe a new data processing method to estimate the proximity to voltage collapse. The method (code-named SMARTDevice, for Stability Monitoring And Reference Tuning Device) employs only local measurements-bus voltage and load current-and calculates the strength of the transmission system relative to the bus. The collapse occurs when the local load approaches this value. The method is simple enough so that it can be implemented in a numerical relay. The performance of SMARTDevice is compared against the conventional undervoltage relay. It is shown that the latter can misoperate while the new device does not. SMARTDevice is in fact a new breed of voltage relays whose setpoint is automatically tuned to the system condition
Keywords :
power system analysis computing; power system dynamic stability; power system measurement; power system protection; power system relaying; power system reliability; relay protection; SMARTDevice method; bus voltage; computer simulation; data processing method; load current; local measurements; numerical relay; power system voltage stability margin estimation; transmission system strength; voltage relays; Centralized control; Communication system control; Data communication; Data processing; Power system management; Power system measurements; Power system reliability; Real time systems; Relays; Voltage;
fLanguage :
English
Journal_Title :
Power Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8950
Type :
jour
DOI :
10.1109/59.780916
Filename :
780916
Link To Document :
بازگشت