DocumentCode :
1536715
Title :
Integrated silicon microspectrometers
Author :
Kong, Seong-Ho ; Correia, José Higino ; De Graaf, Ger ; Bartek, Marian ; Wolffenbuttel, Reinoud F.
Author_Institution :
Delft Univ., Netherlands
Volume :
4
Issue :
3
fYear :
2001
Firstpage :
34
Lastpage :
38
Abstract :
Microspectrometers, which read color and the results from analytical chemistry, are used for quality inspection in industry and agriculture. They read the chromatography results by measuring the IR absorption of the chemical constituent between the IR source and the grating. Micromachining can implement the dispersion and detection elements in a silicon microspectrometer so that it can analyze the spectrum of incident light. The microspectrometer may either operate an array of detectors, each with a uniform spectral response, or scan the dispersion element using a single calibrated detector. Compared to bulky macroscopic devices, this microspectrometer has inferior spectral resolution but its small size and low cost more than compensates for this limitation in many applications.
Keywords :
Fabry-Perot interferometers; Fabry-Perot resonators; elemental semiconductors; infrared detectors; infrared spectrometers; interference spectrometers; micro-optics; micromachining; silicon; spectrochemical analysis; visible spectrometers; Fabry-Perot interferometers; Fabry-Perot resonators; IR absorption; Si; analytical chemistry; array of detectors; dispersion element scanning; integrated silicon microspectrometers; low cost; micromachining; quality inspection; small size; uniform spectral response; visible spectrometer; Agriculture; Chemical elements; Chemistry; Color; Detectors; Electromagnetic wave absorption; Gratings; Inspection; Micromachining; Silicon;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/5289.953457
Filename :
953457
Link To Document :
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