DocumentCode :
1536830
Title :
Triple-push oscillator approach: theory and experiments
Author :
Tang, Yu-Lung ; Wang, Huei
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
36
Issue :
10
fYear :
2001
fDate :
10/1/2001 12:00:00 AM
Firstpage :
1472
Lastpage :
1479
Abstract :
This paper presents the theory and experiments of the triple-push oscillator approach. This oscillator architecture is combined with three identical oscillator subcircuits. An analytical mode analysis is used to describe the behavior of all modes. As will be shown, odd-mode currents in each oscillator subcircuit have a 120° phase shift to one another and thus produce in-phase combining for the third harmonic. The time domain analysis was performed to simulate a triple-push oscillator, showing that the phenomenon of 120° phase shift exists among each oscillator subcircuit. To prove this concept, a 4.9-GHz hybrid bipolar junction transistor (BJT) circuit and a 28.4-GHz heterojunction bipolar transistor (BJT) MMIC chip were demonstrated. The measured results showed that the 4.9-GHz BJT triple-push oscillator delivered an output power of 1.0 dBm at 4.9 GHz with 12.0-dB fundamental rejection, and the 28.4-GHz HBT MMIC chip exhibited a measured center frequency at 28.4 GHz with an output power of -15.4 dBm, while the output powers of the fundamental and the second harmonic signals were suppressed to -21 and -34 dBm
Keywords :
MMIC oscillators; bipolar MMIC; bipolar transistor circuits; microwave oscillators; modal analysis; time-domain analysis; 28.4 GHz; 4.9 GHz; circuit architecture; heterojunction bipolar transistor MMIC chip; hybrid bipolar junction transistor circuit; mode analysis; phase shift; time domain analysis; triple-push oscillator; Analytical models; Circuit simulation; Frequency measurement; Heterojunction bipolar transistors; MMICs; Oscillators; Power generation; Power measurement; Semiconductor device measurement; Time domain analysis;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.953475
Filename :
953475
Link To Document :
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