Title :
Wire Explosion by Electromagnetic Induction
Author :
Van Herel, Ryan ; Sinton, Rowan ; Enright, Wade ; Bodger, Pat
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Canterbury, Christchurch, New Zealand
fDate :
7/1/2012 12:00:00 AM
Abstract :
A conductive plasma channel in the shape of a 360^ helical arc has been realized via the mechanisms of electromagnetic induction and exploding wire (EW). This paper is focused on documenting the restrike (RS) mechanism for a wire exploded via electromagnetic induction. The apparatus is a pair of mutually coupled helical coils, which are arranged on cylindrical polyvinylchloride formers, with a capacitor bank as the energy source. Voltage and current waveforms are presented. The wire explosion by induction exhibits key features that exist in conventional wire explosion by conduction, namely, wire fragmentation, a dwell period, and RS phenomena. Exponential damping envelopes were graphically applied to distinguish between RS and non-RS outcomes of the wire explosions. Photography, visual observation, and copper oxide residue patterns also helped to determine whether an RS took place. Lichtenburg figures in the form of dust trees were found to have formed at some time during the induced EW discharge.
Keywords :
electromagnetic induction; exploding wires; explosions; plasma sources; Lichtenburg figures; capacitor bank; conduction; conductive plasma channel; copper oxide residue patterns; current waveform; cylindrical polyvinylchloride formers; dust tree form; dwell period; electromagnetic induction mechanism; energy source; exploding wire mechanism; exponential damping envelopes; helical arc shape; induced exploding wire discharge; mutually coupled helical coils; photography; restrike mechanism; restrike phenomena; voltage waveform; wire explosion; wire fragmentation; Capacitors; Coils; Explosions; Plasmas; Voltage measurement; Windings; Wires; Electromagnetic induction; exploding wire (EW); plasma generation; restrike (RS);
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2012.2198245