DocumentCode
1537226
Title
Operation of submicrometre lateral bipolar transistors down to 10 K
Author
Jayadev, T.S. ; Woo, J.C.S. ; Verdonckt-Vandebroek, S. ; Wong, S. Simon
Author_Institution
Lockheed Palo Alto Res. Lab., CA, USA
Volume
27
Issue
11
fYear
1991
fDate
5/23/1991 12:00:00 AM
Firstpage
998
Lastpage
1000
Abstract
Experimental results on operating submicrometre lateral bipolar transistors at cryogenic temperatures are reported. These devices, fabricated in standard micrometre CMOS technology, were found to operate satisfactorily with high current gain down to 10 K, which was the lowest temperature tested. This device is of interest in circuits interfacing with log wave infrared detectors and other low-impedance devices.
Keywords
bipolar transistors; cryogenics; 10 K; IR detector interface circuits; cryogenic temperatures; current gain; lateral bipolar transistors; log wave infrared detectors; low-impedance devices; submicron devices;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19910622
Filename
78137
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