Title :
Analysis and fabrication of microaperture GaAs-GaAlAs surface-emitting laser for near-field optical data storage
Author :
Shinada, Satoshi ; Koyama, Fumio ; Nishiyama, Nobuhiko ; Arai, Masakazu ; Iga, Kenichi
Author_Institution :
Precision & Intelligence Lab., Tokyo Inst. of Technol., Yokohama, Japan
Abstract :
We have proposed a microaperture vertical cavity surface-emitting laser (VCSEL) for use in near-field optical data storage. We carried out the near-field analysis of microaperture VCSEL using two-dimensional (2-D) finite element method. We calculated the distribution of optical near-field generated near a microaperture, and showed that the spot size is potentially smaller than 100 nm, which is less than wavelength by a factor of 8. We fabricated a VCSEL loaded by an Au film on the top surface for blocking the emitting light and formed a subwavelength-size aperture using focused ion beam (FIB) etch through this film. Single-mode operation was obtained for a microaperture VCSEL with 3-μm square active region. The differential quantum efficiency was increased by a factor of 3 in comparison with that before forming a 400-nm square aperture. We estimated the power density of light radiated from a 400-nm square aperture to be 0.17 mW/μm2. In addition, we measured the near-field distribution of a 200-nm square aperture VCSEL by using a scanning near-field microscope
Keywords :
III-V semiconductors; aluminium compounds; distributed Bragg reflector lasers; finite element analysis; gallium arsenide; ion beam assisted deposition; laser theory; micro-optics; optical storage; quantum well lasers; semiconductor device models; surface emitting lasers; 100 nm; 2D finite element method; 400 nm; Au film; GaAs-GaAlAs; VCSEL; focused ion beam etch; microaperture GaAs-GaAlAs surface-emitting laser; near-field distribution; near-field optical data storage; power density; scanning near-field microscope; single-mode operation; square aperture; square aperture VCSEL; subwavelength-size aperture; top surface; Apertures; Finite element methods; Memory; Optical device fabrication; Optical films; Optical surface waves; Stimulated emission; Surface emitting lasers; Two dimensional displays; Vertical cavity surface emitting lasers;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/2944.954151