• DocumentCode
    1537555
  • Title

    Transient performance degradation of the LMS, RLS, sign, signed regressor, and sign-sign algorithms with data correlation

  • Author

    Eweda, Eweda

  • Author_Institution
    Mil. Tech. Coll., Cairo, Egypt
  • Volume
    46
  • Issue
    8
  • fYear
    1999
  • fDate
    8/1/1999 12:00:00 AM
  • Firstpage
    1055
  • Lastpage
    1062
  • Abstract
    The transient performance degradation, for correlated input data, is studied for various adaptive algorithms. The algorithms are least mean square (LMS), recursive least squares (RLS), sign (SA), signed regressor (SRA), and sign-sign (SSA). Analysis is performed for adaptive plant identification with stationary Gaussian inputs. A closed-form expression for the mean convergence time is derived for each algorithm. The degradation measure used is the ratio of convergence time for correlated data to the convergence time for white data. The LMS and SRA degradations are the same. The SA and SSA degradations are also the same. The smallest degradation occurs for RLS, the largest for LMS and SRA. The SRA, RLS, and LMS degradations are independent of plant-noise variance. The SA and SSA degradations increase with increased noise variance. The LMS and SRA degradations do not depend upon the weight initialization, RLS (SA and SSA) depends weakly (significantly) upon the weight initialization. The analytical results are supported by simulations
  • Keywords
    adaptive signal processing; correlation theory; filtering theory; least mean squares methods; recursive estimation; transient analysis; LMS algorithms; RLS algorithms; adaptive filtering algorithms; adaptive plant identification; closed-form expression; convergence time; data correlation; degradation measure; mean convergence time; plant-noise variance; sign-sign algorithms; signed regressor algorithms; stationary Gaussian inputs; transient performance degradation; weight initialization; white data; Adaptive algorithm; Analytical models; Closed-form solution; Convergence; Degradation; Least squares approximation; Least squares methods; Performance analysis; Resonance light scattering; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.782049
  • Filename
    782049