DocumentCode
1537555
Title
Transient performance degradation of the LMS, RLS, sign, signed regressor, and sign-sign algorithms with data correlation
Author
Eweda, Eweda
Author_Institution
Mil. Tech. Coll., Cairo, Egypt
Volume
46
Issue
8
fYear
1999
fDate
8/1/1999 12:00:00 AM
Firstpage
1055
Lastpage
1062
Abstract
The transient performance degradation, for correlated input data, is studied for various adaptive algorithms. The algorithms are least mean square (LMS), recursive least squares (RLS), sign (SA), signed regressor (SRA), and sign-sign (SSA). Analysis is performed for adaptive plant identification with stationary Gaussian inputs. A closed-form expression for the mean convergence time is derived for each algorithm. The degradation measure used is the ratio of convergence time for correlated data to the convergence time for white data. The LMS and SRA degradations are the same. The SA and SSA degradations are also the same. The smallest degradation occurs for RLS, the largest for LMS and SRA. The SRA, RLS, and LMS degradations are independent of plant-noise variance. The SA and SSA degradations increase with increased noise variance. The LMS and SRA degradations do not depend upon the weight initialization, RLS (SA and SSA) depends weakly (significantly) upon the weight initialization. The analytical results are supported by simulations
Keywords
adaptive signal processing; correlation theory; filtering theory; least mean squares methods; recursive estimation; transient analysis; LMS algorithms; RLS algorithms; adaptive filtering algorithms; adaptive plant identification; closed-form expression; convergence time; data correlation; degradation measure; mean convergence time; plant-noise variance; sign-sign algorithms; signed regressor algorithms; stationary Gaussian inputs; transient performance degradation; weight initialization; white data; Adaptive algorithm; Analytical models; Closed-form solution; Convergence; Degradation; Least squares approximation; Least squares methods; Performance analysis; Resonance light scattering; Time measurement;
fLanguage
English
Journal_Title
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
Publisher
ieee
ISSN
1057-7130
Type
jour
DOI
10.1109/82.782049
Filename
782049
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