Title :
Elimination of the Skin Effect Error in Heavy-Current Shunts
Author :
Malewski, Ryszard ; Nguyen, Chinh T. ; Feser, Kurt ; Hyltén-Cavallius, Nils
Author_Institution :
Institut de recherche d´´Hydro-Qu??bec, Varennes, Qu??bec, Canada
fDate :
3/1/1981 12:00:00 AM
Abstract :
Summary form only given, as follows.
Keywords :
Circuits; Current density; Current measurement; Skin effect; Thermal resistance; Time measurement; Transient analysis;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1981.5511325
