• DocumentCode
    1538422
  • Title

    Theoretical study of a potential ultraviolet avalanching detector based on impact ionization out of confined quantum states

  • Author

    Wang, Yang ; Brennan, Kevin F. ; Ruden, P.Paul

  • Author_Institution
    Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    2/1/1991 12:00:00 AM
  • Firstpage
    232
  • Lastpage
    237
  • Abstract
    A detailed analysis is given of a possible new ultraviolet photodetector based on impact ionization out of confined quantum states using a GaN-AlxGa1-xN multiple quantum well array. The GaN-AlGaN materials system is continuously gradable in composition and has a large conduction-band-edge discontinuity, which makes it an attractive candidate for asymmetric confined quantum state photomultipliers. The impact-excitation rate is determined for various device geometries and doping concentrations. As the carrier concentration increases in a quantum confined structure. the excitation probability increases. The ionization rate increase is due in part to the increase in the number of carriers within the high-energy subbands of the well with the resulting reduction of the carrier ionization threshold energy
  • Keywords
    III-V semiconductors; aluminium compounds; carrier density; gallium compounds; impact ionisation; photodetectors; semiconductor quantum wells; GaN-AlxGa1-xN multiple quantum well array; III-V semiconductors; asymmetric confined quantum state photomultipliers; carrier concentration; carrier ionization threshold energy; conduction-band-edge discontinuity; device geometries; doping concentrations; excitation probability; impact ionization; impact-excitation rate; ionization rate; ultraviolet avalanching detector; Carrier confinement; Composite materials; Conducting materials; Detectors; Doping; Impact ionization; Information geometry; Photodetectors; Photomultipliers; Potential well;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.78224
  • Filename
    78224