DocumentCode
1538526
Title
General analysis of electrodes in integrated-optics electrooptic devices
Author
Jin, Hang ; Bèlanger, Michel ; Jakubczyk, Zdzislaw
Author_Institution
Nat. Opt. Inst., Sainte-Foy, Que., Canada
Volume
27
Issue
2
fYear
1991
fDate
2/1/1991 12:00:00 AM
Firstpage
243
Lastpage
251
Abstract
Integrated-optics electrooptic devices that rely on the electrooptic effect obtained by applying electric waves on the electrodes deposited on the light waveguides are considered. A general structure for the devices is presented, and a computational method for calculating the electric-field distribution in the structure is described. Comparisons between numerical and exact results are made in cases with a known solution. The effect of the thickness of the electrodes is investigated. The characteristic impedance and effective dielectric constant are presented as a function of the electrode thickness for various width-gap ratios of the electrode structure. Calculations show that the electric field in the substrate is slightly influenced by the electrode thickness, whereas the characteristic impedance and effective dielectric constant are decreased as the electrode thickness is increased
Keywords
electro-optical devices; integrated optics; characteristic impedance; computational method; effective dielectric constant; electric waves; electric-field distribution; electrode structure; electrode thickness; electrooptic modulator; electrooptic switch; general structure; integrated-optics electrooptic devices; light waveguides; substrate; velocity matching; width-gap ratios; Dielectric substrates; Electrodes; Electrooptic devices; Electrooptical waveguides; Optical attenuators; Optical buffering; Optical modulation; Optical refraction; Optical variables control; Optical waveguides;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.78226
Filename
78226
Link To Document