DocumentCode :
1538526
Title :
General analysis of electrodes in integrated-optics electrooptic devices
Author :
Jin, Hang ; Bèlanger, Michel ; Jakubczyk, Zdzislaw
Author_Institution :
Nat. Opt. Inst., Sainte-Foy, Que., Canada
Volume :
27
Issue :
2
fYear :
1991
fDate :
2/1/1991 12:00:00 AM
Firstpage :
243
Lastpage :
251
Abstract :
Integrated-optics electrooptic devices that rely on the electrooptic effect obtained by applying electric waves on the electrodes deposited on the light waveguides are considered. A general structure for the devices is presented, and a computational method for calculating the electric-field distribution in the structure is described. Comparisons between numerical and exact results are made in cases with a known solution. The effect of the thickness of the electrodes is investigated. The characteristic impedance and effective dielectric constant are presented as a function of the electrode thickness for various width-gap ratios of the electrode structure. Calculations show that the electric field in the substrate is slightly influenced by the electrode thickness, whereas the characteristic impedance and effective dielectric constant are decreased as the electrode thickness is increased
Keywords :
electro-optical devices; integrated optics; characteristic impedance; computational method; effective dielectric constant; electric waves; electric-field distribution; electrode structure; electrode thickness; electrooptic modulator; electrooptic switch; general structure; integrated-optics electrooptic devices; light waveguides; substrate; velocity matching; width-gap ratios; Dielectric substrates; Electrodes; Electrooptic devices; Electrooptical waveguides; Optical attenuators; Optical buffering; Optical modulation; Optical refraction; Optical variables control; Optical waveguides;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.78226
Filename :
78226
Link To Document :
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