DocumentCode
1538538
Title
Plasma density decay of vacuum discharges after current zero
Author
Düning, Gerd ; Lindmayer, Manfred
Author_Institution
Inst. fur Hochspannungstechnik und Elektrische Energieanlagen, Tech. Univ. Braunschweig, Germany
Volume
27
Issue
4
fYear
1999
fDate
8/1/1999 12:00:00 AM
Firstpage
923
Lastpage
929
Abstract
In vacuum circuit breakers the post-arc current caused by the remaining ions and electrons in the contact gap is an indication of the residual ionization and its decay. It coincides with the formation of a positive space charge sheath in front of the new cathode, which grows toward the new anode. In a vacuum test chamber an arc (1.5-15 kA RMS) is drawn between high current electrodes of the spiral type. At different times after current zero a transient recovery voltage is applied across a separate pair of high voltage electrodes. In contrast to real circuit breakers, where the transient recovery voltage reappears between the arcing contacts, this separation allows the study of residual plasma free from the thermal stress and melting on the contact surfaces. From the post-arc current across these electrodes, in comparison with a mathematical model of sheath growth, the density of the charge carriers can be evaluated. Such values and their temporal decay are presented
Keywords
plasma density; plasma diagnostics; plasma sheaths; plasma transport processes; vacuum arcs; vacuum circuit breakers; 1.5 to 15 kA; anode; cathode; charge carrier density; collision-free plasma; contact gap; contact surfaces; current zero; density decay; electrons; free recovery; high current electrodes; high voltage electrodes; ions; melting; one-dimensional post-arc model; plasma density decay; positive space charge sheath; positive space charge sheath growth; post-arc current; residual ionization decay; residual plasma; separated high-voltage electrodes; sheath growth; spiral type electrodes; temporal decay; thermal stress; transient recovery voltage; vacuum circuit breakers; vacuum discharges; vacuum test chamber; Anodes; Cathodes; Circuit breakers; Electrodes; Electrons; Ionization; Plasma density; Space charge; Thermal stresses; Voltage;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/27.782261
Filename
782261
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