DocumentCode :
1538544
Title :
Influence of interrupted current amplitude on the post-arc current and gap recovery after current zero-experiment and simulation
Author :
Huber, Eduard F J ; Weltmann, Klaus Dieter ; Fröehlich, Klaus
Author_Institution :
Swiss Federal Inst. of Technol., Zurich, Switzerland
Volume :
27
Issue :
4
fYear :
1999
fDate :
8/1/1999 12:00:00 AM
Firstpage :
930
Lastpage :
937
Abstract :
For commercial vacuum circuit interrupter valves with radial field contact, the post-arc current (PAC) waveform was measured after short circuit current interruption applying a transient recovery voltage (TRV) of about 15 kV/s (RRRV). Keeping the current decline di/dt at current zero constant, the power frequency (PF) current amplitude IˆPF was varied from 0.5 up to two times of the rated short circuit current. Significant influence of IˆPF on the gaps memory is shown in particular effecting the post-arc current duration which varies in a range between 2 and 8 μs. Based on the existing physical models an interpretation of the results is given. It is shown that the memory effect influences the gap recovery time. The experimental results were further used to determine the parameters of the sheath growth model described by Andrews and Varey (1971). The initial ion density is fitted according to the current ramp di/dt before current zero (CZ) and according to the measured QPF=∫i PF×dt during the arcing phase. The results of two different test procedures were applied in order to separate the effect of current ramp di/dt and QPF=∫iPF×dt. The influence of both parameters and of the rate of rise of the recovery voltage du/dt (RRRV) on the sheath edge velocity could be demonstrated by simulation
Keywords :
ion density; plasma transport processes; space charge; vacuum circuit breakers; current decline; current ramp; current zero; current zero constant; current zero experiment; gap recovery; gap recovery time; gaps memory; interrupted current amplitude; post-arc current; post-arc current duration; post-arc current waveform; power frequency current amplitude; radial field contact; recovery voltage rise rate; sheath edge velocity; sheath growth model; short circuit current interruption; simulation; transient recovery voltage; vacuum circuit interrupter valves; Current measurement; Density measurement; Frequency; Interrupters; Q measurement; Random access memory; Short circuit currents; Transient analysis; Valves; Voltage;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.782262
Filename :
782262
Link To Document :
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