Title :
Impact of Process Variations on Upset Reversal in a 65 nm Flip-Flop
Author :
Kauppila, Amy V. ; Ball, Dennis R. ; Bhuva, Bharat L. ; Massengill, Lloyd W. ; Holman, W. Tim
Author_Institution :
Electrical Engineering and Computer Science, Vanderbilt University, Nashville, United States
Abstract :
This work postulates a mechanism, upset reversal, and analyzes the impact of process variations on the mechanism. Process variations are shown to affect the onset of upset reversal for a 65 nm flip-flop.
Keywords :
Inverters; Logic gates; MOSFETs; Monte Carlo methods; Single event upset; Flip-flops; process parameter variations; single event transient; upset reversal;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2196448
