• DocumentCode
    1538605
  • Title

    Physics-based CAD models for the analysis of vias in parallel-plate environments

  • Author

    Abhari, Ramesh ; Eleftheriades, George V. ; Van Deventer-Perkins, Emilie

  • Author_Institution
    Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
  • Volume
    49
  • Issue
    10
  • fYear
    2001
  • fDate
    10/1/2001 12:00:00 AM
  • Firstpage
    1697
  • Lastpage
    1707
  • Abstract
    In this paper, physics-based computer-aided-design (CAD) models for through and buried vias in parallel-plate environments are presented based on radial transmission-line theory. The crosstalk power transferred by the TEM parallel-plate mode between vias is characterized, and extended to the treatment of vias in finite substrates by means of image theory. The presented CAD models can be combined with lumped and distributed circuit elements, as well as linear and nonlinear devices, providing an accurate and fast procedure for the global modeling of high-speed electronic circuits. The corresponding simulation time for representative single or multiple via configurations has been drastically reduced compared to full-wave simulations while maintaining comparable accuracy
  • Keywords
    circuit CAD; circuit noise; circuit simulation; crosstalk; equivalent circuits; packaging; parallel plate waveguides; printed circuit design; TEM parallel-plate mode; buried vias; crosstalk power; distributed circuit elements; finite substrates; global modeling; high-speed electronic circuits; image theory; linear devices; lumped circuit elements; nonlinear devices; parallel-plate environments; physics-based CAD models; radial transmission-line theory; simulation time; through vias; via configurations; Analytical models; Circuit noise; Circuit simulation; Computational modeling; Concurrent computing; Crosstalk; Packaging; Performance analysis; Resonance; Transmission lines;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.954773
  • Filename
    954773