DocumentCode
1538620
Title
Improved SC amplifiers with low sensitivity to op-amp imperfections
Author
Yoshizawa, H. ; Huang, Y. ; Temes, G.C.
Author_Institution
Seiko Instrum. Inc., Chiba, Japan
Volume
33
Issue
5
fYear
1997
fDate
2/27/1997 12:00:00 AM
Firstpage
348
Lastpage
349
Abstract
Two novel SC amplifiers using predictive correlated double sampling are proposed. They exhibit very low sensitivity to most non-ideal op-amp effects
Keywords
harmonic distortion; operational amplifiers; sensitivity analysis; switched capacitor networks; SC amplifiers; THD; low sensitivity; nonideal opamp effects; op-amp imperfections; predictive correlated double sampling;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19970254
Filename
581011
Link To Document