Title :
Improved SC amplifiers with low sensitivity to op-amp imperfections
Author :
Yoshizawa, H. ; Huang, Y. ; Temes, G.C.
Author_Institution :
Seiko Instrum. Inc., Chiba, Japan
fDate :
2/27/1997 12:00:00 AM
Abstract :
Two novel SC amplifiers using predictive correlated double sampling are proposed. They exhibit very low sensitivity to most non-ideal op-amp effects
Keywords :
harmonic distortion; operational amplifiers; sensitivity analysis; switched capacitor networks; SC amplifiers; THD; low sensitivity; nonideal opamp effects; op-amp imperfections; predictive correlated double sampling;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19970254
