Title :
CMOS device with self-aligned source/drain using amorphous silicon local interconnection layer
Author :
Yoon, Yong-Sun ; Baek, Kyu-Ha ; Nam, Kee-Soo
Author_Institution :
Electron. & Telecommun. Res. Inst., Taejon, South Korea
fDate :
2/27/1997 12:00:00 AM
Abstract :
A novel CMOS device, which has a self-aligned source/drain structure using an amorphous silicon local interconnection (ASLI) layer is demonstrated. The proposed device not only has very small areas of source/drain junctions, but also has shallow junction depths much shallower than conventional structures. The capacitance reduction of the source/drain junctions significantly enhances the operating speed
Keywords :
CMOS integrated circuits; amorphous semiconductors; capacitance; integrated circuit interconnections; integrated circuit technology; ASLI layer; CMOS device; Si; amorphous Si local interconnection layer; capacitance reduction; operating speed enhancement; self-aligned source/drain; shallow junction depths;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19970262