DocumentCode :
1538863
Title :
Experimental demonstration of a balanced electroabsorption modulated microwave photonic link
Author :
Mathai, Sagi ; Cappelluti, Federica ; Jung, Thomas ; Novak, Dalma ; Waterhouse, Rodney B. ; Sivco, Deborah ; Cho, Alfred Y. ; Ghione, Giovanni ; Wu, Ming C.
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Volume :
49
Issue :
10
fYear :
2001
fDate :
10/1/2001 12:00:00 AM
Firstpage :
1956
Lastpage :
1961
Abstract :
A novel balanced electroabsorption modulated photonic link for simultaneous suppression of even-order distortions, third-order distortions, laser relative intensity noise (RIN), and common amplified spontaneous emission noise at the same modulator bias point was experimentally demonstrated for the first time. By biasing the balanced electroabsorption modulator at the third-order null, the third-order distortions were suppressed, while the balanced link architecture suppressed all even-order distortions and common mode noises. The fabricated balanced electroabsorption modulator (B-EAM) showed well-matched dc characteristics in terms of I-V and transfer curve. System experiments were performed to compare single-EAM and B-EAM links. In the B-EAM link, 2-dB suppression of laser RIN and 20-dB improvement in spurious free dynamic range over the single-EAM link were observed
Keywords :
electro-optical modulation; intermodulation distortion; microwave photonics; optical fibre communication; optical noise; B-EAM; balanced electroabsorption modulated link; common amplified spontaneous emission noise; even-order distortions; laser relative intensity noise; microwave photonic link; modulator bias point; spurious free dynamic range; third-order distortions; well-matched dc characteristics; Distributed feedback devices; Intensity modulation; Laser modes; Laser noise; Masers; Noise measurement; Optical distortion; Optical modulation; Semiconductor device noise; Spontaneous emission;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.954814
Filename :
954814
Link To Document :
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