DocumentCode :
1538912
Title :
VLSI partitioning of a 2-Gs/s digital spectrometer
Author :
Von Herzen, Brian
Author_Institution :
Caltech Submillimeter Obs., Hilo, HI, USA
Volume :
26
Issue :
5
fYear :
1991
fDate :
5/1/1991 12:00:00 AM
Firstpage :
768
Lastpage :
772
Abstract :
A digital correlating spectrometer for radioastronomy that is based on a custom GaAs digitizer and a custom micropipelined CMOS correlator is described. The digitizer quantizes at two gigasamples per second (Gs/s) and 2-b resolution. A GaAs demultiplexer distributes the data into eight parallel streams of 250 Ms/s each. The CMOS correlator operates at 250 Ms/s using 20 mW per correlator lag. The correlator output is processed on a host microcomputer to create a 1-GHz spectrum of the input signal that can be displayed interactively. An 8×9-mm chip is being developed in a 2-μ process that contains 320 correlator lags. The design is partitioned into GaAs and CMOS components according to the required throughput at each stage of the system. The fastest signals (2 GHz) are kept on the chip level to minimize delay, crosstalk, system noise, and power consumption. Moderate-speed signals (250 MHz) are driven by GaAs components. CMOS components are used where high-speed outputs are not required. A strong synergy between the correlator architecture and micropipelined CMOS technology improves the performance by an order of magnitude compared to existing designs. Preliminary correlator chips have been built and tested at 250 Ms/s; final chips are under design
Keywords :
CMOS integrated circuits; VLSI; analogue-digital conversion; astronomical instruments; computerised signal processing; correlators; digital signal processing chips; microwave spectrometers; pipeline processing; radiotelescopes; 2 micron; GaAs components; GaAs demultiplexer; VLSI partitioning; custom GaAs digitizer; custom micropipelined CMOS correlator; digital correlating spectrometer; radioastronomy; CMOS technology; Correlators; Crosstalk; Gallium arsenide; Microcomputers; Signal processing; Signal resolution; Spectroscopy; Throughput; Very large scale integration;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.78247
Filename :
78247
Link To Document :
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