DocumentCode
1539298
Title
Hidden Markov models with patterns to learn Boolean vector sequences and applications to the built-in self-test for integrated circuits
Author
Bréhélin, Laurent ; Gascuel, Olivier ; Caraux, Gilles
Author_Institution
Dept. Inf. Fondamentale et Applications, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Volume
23
Issue
9
fYear
2001
fDate
9/1/2001 12:00:00 AM
Firstpage
997
Lastpage
1008
Abstract
We present a new model, derived from the hidden Markov model (HMM), to learn Boolean vector sequences. Our HMM with patterns (HMMP) is a simple, hybrid, and interpretable model that uses Boolean patterns to define emission probability distributions attached to states. Vectors consistent with a given pattern are equally probable, while inconsistent ones have probability zero to be emitted. We define an efficient learning algorithm for this model, which relies on the maximum likelihood principle, and proceeds by iteratively simplifying the structure and updating the parameters of an initial specific HMMP that represents the learning sequences. HMMPs and our learning algorithm are applied to the built-in self-test (BIST) for integrated circuits, which is one of the key microelectronic problems. An HMMP is learned from a test sequence set that covers most of the potential faults of the circuit at hand. Then, this HMMP is used as test sequence generator. The experiments carried out show that learned HMMPs have a very high fault coverage
Keywords
Boolean functions; built-in self test; hidden Markov models; integrated circuit testing; learning (artificial intelligence); pattern recognition; probability; BIST; Boolean vector sequences; built-in self-test; hidden Markov model; integrated circuits; iterative method; maximum likelihood; probability distribution; structure learning; test sequence generator; Built-in self-test; Circuit faults; Circuit testing; Hidden Markov models; Integrated circuit modeling; Iterative algorithms; Learning automata; Merging; Microelectronics; Probability distribution;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/34.955112
Filename
955112
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