• DocumentCode
    1539298
  • Title

    Hidden Markov models with patterns to learn Boolean vector sequences and applications to the built-in self-test for integrated circuits

  • Author

    Bréhélin, Laurent ; Gascuel, Olivier ; Caraux, Gilles

  • Author_Institution
    Dept. Inf. Fondamentale et Applications, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
  • Volume
    23
  • Issue
    9
  • fYear
    2001
  • fDate
    9/1/2001 12:00:00 AM
  • Firstpage
    997
  • Lastpage
    1008
  • Abstract
    We present a new model, derived from the hidden Markov model (HMM), to learn Boolean vector sequences. Our HMM with patterns (HMMP) is a simple, hybrid, and interpretable model that uses Boolean patterns to define emission probability distributions attached to states. Vectors consistent with a given pattern are equally probable, while inconsistent ones have probability zero to be emitted. We define an efficient learning algorithm for this model, which relies on the maximum likelihood principle, and proceeds by iteratively simplifying the structure and updating the parameters of an initial specific HMMP that represents the learning sequences. HMMPs and our learning algorithm are applied to the built-in self-test (BIST) for integrated circuits, which is one of the key microelectronic problems. An HMMP is learned from a test sequence set that covers most of the potential faults of the circuit at hand. Then, this HMMP is used as test sequence generator. The experiments carried out show that learned HMMPs have a very high fault coverage
  • Keywords
    Boolean functions; built-in self test; hidden Markov models; integrated circuit testing; learning (artificial intelligence); pattern recognition; probability; BIST; Boolean vector sequences; built-in self-test; hidden Markov model; integrated circuits; iterative method; maximum likelihood; probability distribution; structure learning; test sequence generator; Built-in self-test; Circuit faults; Circuit testing; Hidden Markov models; Integrated circuit modeling; Iterative algorithms; Learning automata; Merging; Microelectronics; Probability distribution;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.955112
  • Filename
    955112