• DocumentCode
    1539324
  • Title

    Space charge induced variation in silicon double drift IMPATT diode parameters

  • Author

    Shukla, S.R.

  • Author_Institution
    Solidstate Phys. Lab., Delhi, India
  • Volume
    144
  • Issue
    1
  • fYear
    1997
  • fDate
    2/1/1997 12:00:00 AM
  • Firstpage
    36
  • Lastpage
    39
  • Abstract
    The effect of space charge on the space charge region (SCR) width, diode voltage and the maximum field in Si double drift IMPATT diode is studied under the operating conditions for various current and doping densities. The rate of increase in SCR width and diode voltage with current density depends appreciably on majority carriers´ space charge. The simple analytical expression for the variation of these parameters with current density is presented. The author´s analytical expression for the variation of SCR width and diode voltage with current density is found to be the best fit throughout the range, while Kuno´s approximate estimation (1979) for the increase of SCR width is valid only at low current densities where the carriers´ space charge is insignificant. The analytical expression and the data are thus useful for the design of practical IMPATT diodes at microwave and millimetre wave frequencies
  • Keywords
    IMPATT diodes; current density; elemental semiconductors; microwave diodes; millimetre wave diodes; silicon; space charge; Si; Si double drift IMPATT diode; analytical expression; current density; design; diode voltage; doping density; microwave frequencies; millimetre wave frequencies; space charge induced variation;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2409
  • Type

    jour

  • DOI
    10.1049/ip-cds:19970747
  • Filename
    581236