DocumentCode
1539324
Title
Space charge induced variation in silicon double drift IMPATT diode parameters
Author
Shukla, S.R.
Author_Institution
Solidstate Phys. Lab., Delhi, India
Volume
144
Issue
1
fYear
1997
fDate
2/1/1997 12:00:00 AM
Firstpage
36
Lastpage
39
Abstract
The effect of space charge on the space charge region (SCR) width, diode voltage and the maximum field in Si double drift IMPATT diode is studied under the operating conditions for various current and doping densities. The rate of increase in SCR width and diode voltage with current density depends appreciably on majority carriers´ space charge. The simple analytical expression for the variation of these parameters with current density is presented. The author´s analytical expression for the variation of SCR width and diode voltage with current density is found to be the best fit throughout the range, while Kuno´s approximate estimation (1979) for the increase of SCR width is valid only at low current densities where the carriers´ space charge is insignificant. The analytical expression and the data are thus useful for the design of practical IMPATT diodes at microwave and millimetre wave frequencies
Keywords
IMPATT diodes; current density; elemental semiconductors; microwave diodes; millimetre wave diodes; silicon; space charge; Si; Si double drift IMPATT diode; analytical expression; current density; design; diode voltage; doping density; microwave frequencies; millimetre wave frequencies; space charge induced variation;
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings -
Publisher
iet
ISSN
1350-2409
Type
jour
DOI
10.1049/ip-cds:19970747
Filename
581236
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