• DocumentCode
    1539325
  • Title

    Curvature estimation in oriented patterns using curvilinear models applied to gradient vector fields

  • Author

    Van de Weijer, Joost ; Van Vliet, Lucas J. ; Verbeek, Piet W. ; Van Ginkel, Michael

  • Author_Institution
    Fac. of Sci., Amsterdam Univ., Netherlands
  • Volume
    23
  • Issue
    9
  • fYear
    2001
  • fDate
    9/1/2001 12:00:00 AM
  • Firstpage
    1035
  • Lastpage
    1042
  • Abstract
    Curved oriented patterns are dominated by high frequencies and exhibit zero gradients on ridges and valleys. Existing curvature estimators fail here. The characterization of curved oriented patterns based on translation invariance lacks an estimation of local curvature and yields a biased curvature-dependent confidence measure. Using parameterized curvilinear models we measure the amount of local gradient energy along the model gradient as a function of model curvature. Minimizing the residual energy yields a closed-form solution for the local curvature estimate and the corresponding confidence measure. We show that simple curvilinear models are applicable in the analysis of a wide variety of curved oriented patterns
  • Keywords
    estimation theory; gradient methods; pattern recognition; vectors; anisotropy; confidence measure; curvature estimation; curvilinear models; gradient energy; gradient vector fields; oriented pattern; translation invariance; Anisotropic magnetoresistance; Closed-form solution; Energy measurement; Frequency; Image analysis; Image processing; Image segmentation; Interference; Pattern analysis; Yield estimation;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.955116
  • Filename
    955116