• DocumentCode
    1539329
  • Title

    Diffusion analysis of track loss in clutter

  • Author

    Rogers, Steven R.

  • Author_Institution
    ELTA Electron., Ashdod, Israel
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    380
  • Lastpage
    387
  • Abstract
    In tracking a target through clutter, the selection of incorrect measurements for track updating causes track divergence and eventual loss of track. The plot-to-track association algorithm is modeled as a Markov process and the tracking error is modeled as a diffusion process in order to study the mechanism of track loss analytically, without recourse to Monte Carlo simulations, for nearest-neighbor association in two space dimensions. The time evolution of the error distribution is examined, and the connection of the approach with diffusion theory is discussed. Explicit results showing the dependence of various performance parameters, such as mean time to lose track and track half-life, on the clutter spatial density are presented. The results indicate the existence of a critical density region in which the tracking performance degrades rapidly with increasing clutter density. An optimal gain adaptation procedure that significantly improves the tracking performance in the critical region is proposed
  • Keywords
    Markov processes; Monte Carlo methods; error statistics; radar clutter; tracking systems; Markov process; Monte Carlo simulations; clutter density; clutter spatial density; critical density; diffusion analysis; diffusion process; diffusion theory; error distribution; mean time; nearest-neighbor association; optimal gain adaptation; plot-to-track association algorithm; radar clutter; track divergence; track loss; track updating; tracking error; Aerodynamics; Algorithm design and analysis; Clutter; Degradation; Loss measurement; Markov processes; Neural networks; Performance analysis; Performance gain; Target tracking;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/7.78312
  • Filename
    78312