• DocumentCode
    1539367
  • Title

    Investigation of the Packaging-Induced RF Attenuations and Resonances in a Broadband Optoelectronic Modulator Module

  • Author

    Han, Wei ; Rensing, Marc ; Wang, Xin ; Yang, Hua ; Peters, Frank H. ; O´Brien, Peter

  • Author_Institution
    Integrated Photonics Group, Tyndall Nat. Inst., Cork, Ireland
  • Volume
    30
  • Issue
    16
  • fYear
    2012
  • Firstpage
    2610
  • Lastpage
    2617
  • Abstract
    In this paper, the influence of packaging-induced RF signal degradation on an optoelectronic modulator module is investigated. A directly modulated laser (DML) is modeled and packaged in a butterfly-type package. A distributed 3-D electromagnetic model is built based on this laser module. In the packaging assembly procedure, impedance mismatching and ground discontinuity on microwave transmission will cause unwanted signal decays and resonances. We specify the RF degradation in three regions: 1) the RF connector, 2) the RF substrate, and 3) the mode transition region between the optoelectronic subsystem and the package. The RF transmission characteristics in these regions are extracted and analyzed in detail. The results indicate that by optimizing the packaging design, strong resonances and signal decays can be eliminated or compensated over a wide frequency range. The measured scattering parameters show that the proposed packaging assembly has a resonance-free bandwidth of 31.2 GHz, and the DML module exhibits a wide 3 dB bandwidth of 15.1 GHz.
  • Keywords
    integrated circuit packaging; integrated optoelectronics; microwave photonics; modulators; DML module; RF connector; RF degradation; RF substrate; RF transmission characteristics; bandwidth 15.1 GHz; bandwidth 31.2 GHz; broadband optoelectronic modulator module; butterfly-type package; directly modulated laser; distributed 3D electromagnetic model; ground discontinuity; impedance mismatching; laser module; microwave transmission; mode transition region; optoelectronic subsystem; packaging assembly procedure; packaging design; packaging-induced RF attenuations; packaging-induced RF signal degradation; resonance-free bandwidth; scattering parameters; unwanted signal decays; Assembly; Connectors; Integrated circuit modeling; Laser modes; Measurement by laser beam; Packaging; Radio frequency; Equivalent circuit model; microwave packaging technologies; optoelectronic modulators; scattering parameters; semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2012.2204727
  • Filename
    6217264