DocumentCode :
1539460
Title :
Holographic sizing of contaminants in HV XLPE cable
Author :
Hong, Zhao ; Demin, Tu ; Zhuguo, Hu ; Ziyu, Liu ; Lupin, Liu ; Weijun, Teng
Author_Institution :
Dept. of Electr. Mater. Eng., Harbin Inst. of Electr. Technol., China
Volume :
26
Issue :
2
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
217
Lastpage :
221
Abstract :
A method is developed to size the particles of contaminants in insulation of HV crosslinked polyethylene cable by using a Fraunhofer far-field in-line holographic technique with no need to cut the insulation into thin slices. The maximum thickness of the sample is 4.0 cm, when a resolution of 50 μm is obtained. The accuracy of measurement is ~10% for particles >20 μm diameter
Keywords :
cable insulation; holography; insulation testing; organic insulating materials; particle size measurement; polymers; 50 micron; Fraunhofer far-field in-line holographic technique; HV XLPE cable; accuracy; contaminants; crosslinked polyethylene; particle sizing; Cable insulation; Dielectrics and electrical insulation; Holographic optical components; Holography; Lenses; Optical filters; Optical recording; Particle measurements; Pollution measurement; Size measurement;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/14.78320
Filename :
78320
Link To Document :
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