Title :
An Ultrafast Fault Sensor for a Fault Current Limiting Device
Author :
Lee, I. ; Carberry, R. ; Knauer, W. ; Renz, B.A. ; Horowitz, S.H.
Author_Institution :
Hughes Research Laboratories, Malibu, CA
fDate :
7/1/1981 12:00:00 AM
Abstract :
Summary form only given, as follows.
Keywords :
Circuit faults; Cross layer design; Current limiters; Fault currents; Power system transients; Transient analysis;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1981.5511672
