DocumentCode
1539618
Title
Critical current measurements on large conductors of niobium-titanium/copper cable embedded in an aluminum stabilizer
Author
Walsh, R.P. ; Miller, J.R. ; O´Connor, T.G.
Author_Institution
Nat. High Magnetic Field Lab., Tallahassee, FL, USA
Volume
9
Issue
2
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
146
Lastpage
148
Abstract
Insertion of a flat, Rutherford type cable of NbTi/Cu composite strands into a rectangular profile of high purity aluminum is an established method of superconductor fabrication for certain applications. Although this processing scheme has numerous advantages it produces a composite material whose properties are difficult to predict with precision. The BABAR detector magnet being tested at the Stanford Linear Accelerator Center, uses high-purity aluminum stabilized superconducting cable. The performance of the superconductor is dependent on the quality of the fabrication of the composite conductor. Here we present measurements of the critical transport current of BABAR production grade conductors up to 10 kA, and at fields up to 10 T. Data are related to production variables, compared to estimates from simple models, and evaluated with respect to design specifications.
Keywords
aluminium; copper; critical current density (superconductivity); electric current measurement; niobium alloys; superconducting cables; superconducting coils; titanium alloys; BABAR detector magnet; BABAR production grade conductors; NbTi-Cu-Al; NbTi/Cu composite strands; Stanford Linear Accelerator Center; aluminum stabilizer; coils; critical current measurements; critical transport current; flat Rutherford type cable; high-purity aluminum stabilized superconducting cable; niobium-titanium/copper cable; production variables; rectangular profile; superconductor fabrication; Aluminum; Conducting materials; Conductors; Critical current; Current measurement; Fabrication; Niobium compounds; Production; Superconducting cables; Superconducting magnets;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.783257
Filename
783257
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