Title :
Electronically-scanned white light interferometry with enhanced dynamic range
Author :
Chen, S. ; Meggitt, B.T. ; Rogers, A.J.
Author_Institution :
Dept. of Electron. & Electr. Eng., King´´s Coll., London, UK
Abstract :
When a CCD array is used to detect the spatial fringes of optical interference, interesting features emerge in the output as the width of each fringe approaches the dimension of a CCD sensing cell. These features are theoretically studied and their application to the enhancement of the dynamic operating range of electrically scanned white-light interferometry is investigated. Preliminary experimental results are presented.
Keywords :
CCD image sensors; light interferometry; moire fringes; position measurement; 0.3 mm; CCD array; CCD array Moire fringes; CCD image sensors; electrically scanned white-light interferometry; electronically scanned white light interferometry; enhanced dynamic range; experimental results; features; spatial fringes of optical interference;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19901065
