DocumentCode :
1540024
Title :
Visualization of Fluid/Structure Interaction in IC Encapsulation
Author :
Khor, Chu Yee ; Abdullah, Mohd Zulkifly ; Leong, Wei Chiat
Author_Institution :
Sch. of Mech. Eng., Univ. Sains Malaysia, Minden, Malaysia
Volume :
2
Issue :
8
fYear :
2012
Firstpage :
1239
Lastpage :
1246
Abstract :
This paper presents the visualization of the fluid/structure interaction (FSI) in molded integrated-circuit (IC) packaging. The complexity and high cost of the experimental setup in the molded packaging make the FSI visualization difficult during the encapsulation process, particularly for tiny and thinned chips in IC packages. To address this problem, we fabricated a scaled-up transparent molded package, and the encapsulation process was experimentally performed to visualize the FSI phenomenon. Two scaled-up (single- and stacked-chip) IC packages were considered in the experiment to investigate the FSI, flow front advancement, and void formation. The void formation mechanisms for both imitated IC packages were also studied. Moreover, finite-volume and finite-element codes, via the mesh-based parallel code coupling interface method, were used to describe the physics of FSI during the encapsulation. The predicted flow front advancement, flow profiles, and chip deformation were validated with the experimental results. Hence, this paper is expected to provide a better understanding of the FSI phenomenon during the IC encapsulation.
Keywords :
encapsulation; finite element analysis; finite volume methods; flow visualisation; integrated circuit packaging; moulding; encapsulation process; finite element code; finite volume code; fluid-structure interaction; integrated circuit Encapsulation; mesh based parallel code coupling interface method; molded integrated circuit packaging; scaled up transparent molded package; single chip IC package; stacked chip IC package; Cavity resonators; Encapsulation; Integrated circuit modeling; Mathematical model; Visualization; Finite element (FE); finite volume (FV); fluid/structure interaction (FSI); integrated-circuit (IC) packaging;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2012.2199117
Filename :
6217396
Link To Document :
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