DocumentCode :
1540099
Title :
Error correction techniques for high-performance differential A/D converters
Author :
Tan, Khen-Sang ; Kiriaki, Sami ; De Wit, Michiel ; Fattaruso, John W. ; Tsay, Ching-Yuh ; Matthews, W. Edward ; Hester, Richard K.
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Volume :
25
Issue :
6
fYear :
1990
fDate :
12/1/1990 12:00:00 AM
Firstpage :
1318
Lastpage :
1327
Abstract :
Error correction techniques that overcome several error mechanism that can affect the accuracy of charge-redistribution analog-to-digital converters (ADCs) are described. A correction circuit and a self-calibration algorithm are used to improve the common-mode rejection of the differential ADC. A modified technique is used to self-calibrate the capacitor ratio errors and obtain higher linearity. The residual error of the ADC due to capacitor voltage dependence is minimized using a quadratic voltage coefficient (QVC) self-calibration scheme. A dual-comparator topology with digital error correction circuitry is used to avoid errors due to comparator threshold hysteresis. A fully differential charge-redistribution ADC implemented with these techniques was fabricated in a 5-V 1-μm CMOS process using metal-to-polysilicide capacitors. The successive-approximation converter achieves 16-b accuracy with more than 90 dB of common-mode rejection while converting at a 200-kHz rate
Keywords :
CMOS integrated circuits; analogue-digital conversion; error correction; 1 micron; CMOS process; capacitor ratio errors; capacitor voltage dependence; charge-redistribution analog-to-digital converters; common-mode rejection; comparator threshold hysteresis; correction circuit; differential A/D converters; digital error correction circuitry; dual-comparator topology; error mechanism; linearity; quadratic voltage coefficient; residual error; self-calibration algorithm; successive-approximation converter; Analog circuits; Analog-digital conversion; CMOS logic circuits; CMOS process; Capacitors; Circuit noise; Dynamic range; Error correction; Semiconductor device noise; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.62175
Filename :
62175
Link To Document :
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