DocumentCode :
1540380
Title :
Analysis of Nb superconductor-insulator-superconductor tunnel junctions with Al striplines for THz radiation detection
Author :
Dieleman, P. ; Klapwijk, T.M. ; Gao, J.R. ; van de Stadt, H.
Author_Institution :
Dept. of Appl. Phys., Groningen Univ., Netherlands
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
2566
Lastpage :
2569
Abstract :
We study the gain and noise of a receiver consisting of a niobium junction embedded in an aluminum impedance matching circuit. The junction is operated in a waveguide mount with an adjustable backshort. The uncorrected double side band noise temperatures are 940 K to 1388 K for 820 to 980 GHz respectively. The total optical loss is obtained from the losses of the individual components, the losses in the stripline are calculated using the Reuter-Sondheimer equation in the extreme anomalous limit. The embedding impedance follows from the pumped curves and the Tucker equations which are also used to determine the noise and gain of the junction. The main limitation to the receiver sensitivity is shown to be the loss in the aluminum circuit.
Keywords :
aluminium; impedance matching; niobium; strip lines; submillimetre wave mixers; submillimetre wave receivers; superconducting device testing; superconducting microwave devices; superconductive tunnelling; superconductor-insulator-superconductor mixers; 820 to 980 GHz; Al; Nb; Reuter-Sondheimer equation; THz radiation detection; Tucker equations; adjustable backshort; double side band noise temperatures; embedding impedance; extreme anomalous limit; heterodyne mixers; impedance matching circuit; receiver sensitivity; superconductor-insulator-superconductor tunnel junctions; total optical loss; waveguide mount; Aluminum; Circuit noise; Niobium; Optical losses; Optical noise; Optical receivers; Optical waveguides; Superconducting device noise; Superconducting devices; Waveguide junctions;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.621763
Filename :
621763
Link To Document :
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