Title :
A probabilistic explanation of dark line features observed in images with speckle
Author :
Hirosawa, Haruto
Author_Institution :
Inst. of Space & Astronaut. Sci., Kanagawa, Japan
fDate :
5/1/1997 12:00:00 AM
Abstract :
A probabilistic explanation is given to randomly-distributed, dark curved-line patterns which the authors observe in images with speckle, such as in one-look synthetic aperture radar images. Also it is shown that multi-look processing weakens the appearance of such line features
Keywords :
geophysical signal processing; geophysical techniques; radar imaging; remote sensing by radar; speckle; synthetic aperture radar; visual perception; SAR; dark line feature; human factor; image processing; land surface; measurement technique; multi-look processing; probabilistic explanation; radar image; radar imaging; radar remote sensing; randomly-distributed dark curved-line pattern; speckle; synthetic aperture radar; terrain mapping; visual perception; Adaptive optics; Books; Chaos; Image generation; Laser radar; Layout; Light sources; Optical scattering; Speckle; Synthetic aperture radar;
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
