Title :
Fault detection method using power supply spectrum analysis
Author :
Lee, P. ; O´Leary, P.
Author_Institution :
Austria Mikro Syst. Int. GmbH, Unterpremstatten, Austria
Abstract :
A test method is presented which uses power supply current spectrum measurements to identify and localise faults in CMOS integrated circuits. Measurements on a mixed analogue and digital test chip are presented to verify the proposed test method.
Keywords :
CMOS integrated circuits; fault location; spectral analysis; CMOS integrated circuits; current spectrum measurements; faults; mixed analogue/digital chip; power supply spectrum analysis; test method;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19901106
