• DocumentCode
    1540448
  • Title

    Resistive fault current limiters with YBCO films 100 kVA functional model

  • Author

    Gromoll, B. ; Ries, G. ; Schmidt, W. ; Kraemer, H.-P. ; Seebacher, B. ; Utz, B. ; Nies, R. ; Neumueller, H.-W. ; Baltzer, E. ; Fischer, S. ; Heismann, B.

  • Author_Institution
    Siemens AG, Erlangen, Germany
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    656
  • Lastpage
    659
  • Abstract
    Within the Siemens current limiter program a 100 kVA functional model has been realized and tested successfully. According to the modular concept of the limiter the functional model is assembled of ten switching elements. YBCO-films with a thickness of 250 nm and a critical current density above 2/spl times/10/sup 6/ A/cm/sup 2/ are deposited by thermal coevaporation (TU Munich) on 4" sapphire wafers. To support homogeneous switching the superconducting film is covered with a 100 nm Au-shunt layer. Good current limiting performance is achieved: the steady limiting current is below the nominal current, the peak fault current increases up to 3 times the nominal current within an action time of one millisecond. The operational recovery time of the limiter, within which the switching elements return to the superconductive state again is about 2 s. Following our limiter program the next step will be a model device with a nominal switching power of 1 MVA.
  • Keywords
    barium compounds; fault current limiters; high-temperature superconductors; superconducting devices; superconducting thin films; yttrium compounds; 100 kVA; 100 nm; 250 nm; 4 in; Au-shunt layer; Siemens current limiter program; YBCO films; YBaCuO; YBaCuO films; critical current density; current limiting performance; homogeneous switching; modular concept; operational recovery time; peak fault current; resistive fault current limiters; sapphire wafers; steady limiting current; superconducting film; superconductive state; switching elements; thermal coevaporation; Assembly; Critical current density; Current limiters; Fault current limiters; Fault currents; Semiconductor device modeling; Superconducting films; Superconductivity; Testing; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.783381
  • Filename
    783381