Title :
Effect of a uniform magnetic field on the I-V curves of SFFTs
Author :
Bernstein, P. ; Picard, C. ; Hamet, J.F. ; Prouteau, C. ; Contour, J.P. ; Drouet, M.
Author_Institution :
CRISMAT, CNRS, Caen, France
fDate :
6/1/1997 12:00:00 AM
Abstract :
The connection between the effect of a uniform magnetic field on the I-V curves measured on the microbridges of superconducting flux flow transistors and the vortex dynamics is studied with the help of a model assuming that the motion of the vortices is due to a diffusion process. It is shown that the application of the field results in a critical current reduction which depends on the amplitude of the field and the thickness of the film only. As a consequence the effective thickness of the superconducting layer of the studied microbridges can be estimated from I-V measurements carried out with and without applied field.
Keywords :
characteristics measurement; critical current density (superconductivity); flux flow; high-temperature superconductors; magnetic field effects; superconducting device testing; superconducting junction devices; superconducting microbridges; superconducting transistors; I-V curves; I-V measurements; SFFTs; critical current reduction; diffusion process; microbridges; model; superconducting flux flow transistors; uniform magnetic field; vortex dynamics; Bridges; Critical current; Current measurement; Diffusion processes; Magnetic field measurement; Motion measurement; Superconducting epitaxial layers; Superconducting films; Thickness measurement; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
