Title :
Robust superconducting die attach process
Author :
Yokoyama, K.E. ; Akerling, G. ; Smith, A.D. ; Wire, M.
Author_Institution :
Space & Electron. Group, TRW Inc., Redondo Beach, CA, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
As complexity of superconducting digital systems increase, the need for multi-chip modules and a reliable, high bandwidth attachment scheme for superconducting die becomes more and more critical. We have developed a flip chip die attach process for Low Temperature Superconducting (LTS) chips using InSn reflow soldering. Using standard reflow techniques, we create highly reproducible, uniform 14 micron-high solder bumps on gold-defined pad regions. Subsequent alignment, compression, and reflow soldering produce reliable, low inductance connections with high yield. The short interconnect distance of 5-7 /spl mu/m results in low enough inductance to support multi-GHz chip interconnect at low impedance. We have successfully tested and thermally cycled flip chipped die over many temperature cycles to liquid helium temperatures with no failures. We will report on successful attachment, testing, and rework of superconducting circuit chips. Specifically, we present data on solder bump uniformity, yield, electrical and thermal characteristics, reworkability, and reliability under repeated thermal cycling.
Keywords :
digital integrated circuits; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; integrated circuit yield; multichip modules; reflow soldering; superconducting integrated circuits; 5 to 7 micron; flip chip die attach process; interconnect distance; liquid helium temperatures; low inductance connections; low temperature superconducting chips; multi-chip modules; pad regions; reflow soldering; reliability; reworkability; solder bump uniformity; solder bumps; superconducting circuit chips; superconducting die attach process; superconducting digital systems; thermal cycling; yield; Bandwidth; Circuit testing; Digital systems; Flip chip; Inductance; Integrated circuit interconnections; Microassembly; Reflow soldering; Robustness; Temperature;
Journal_Title :
Applied Superconductivity, IEEE Transactions on