Title :
Formal Theoretical Foundation of Electrical Aging of Dielectrics
Author :
Kiersztyn, Stanley E.
Author_Institution :
General Electric Company, Bridgeport, Connecticut
Abstract :
Summary form only given, as follows.
Keywords :
Aging; Degradation; Dielectric breakdown; Differential equations; Electric breakdown; Mathematical model; Probability distribution; Residual stresses;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1981.5511887
