DocumentCode :
1540616
Title :
Self-field AC losses of assemblies of Ag sheathed PbBi2223 tapes
Author :
Hughes, T.J. ; Yang, Y. ; Beduz, C. ; Power, A.
Author_Institution :
Inst. of Cryogenics, Southampton Univ., UK
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
774
Lastpage :
777
Abstract :
Magnetic interaction between two neighbouring superconducting tapes carrying a transport current can cause them to become coupled so that they react as one tape. One of the consequences of such coupling is the increase in the self-field loss per tape. The critical distance at which the tapes begin to couple is important in the assessment of the interactions among tapes in systems such as a power cable or coil. Experimental measurements of the self-field losses in two neighbouring Ag sheathed PbBi2223 tapes carrying the same transport current were carried out with the two tapes separated by various distances, while placed one on top of the other (stack-configuration). This configuration is similar to that found in adjacent layers in a coil. The results indicate that the critical coupling distance for the top-configuration is about 5 mm, where the increase in loss per tape is about 10%. Measurements are also undertaken for the more realistic situation where each of the tapes has a different critical current.
Keywords :
bismuth compounds; calcium compounds; high-temperature superconductors; loss measurement; silver; strontium compounds; superconducting tapes; (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O-Ag tapes; (BiPb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O-Ag; Ag sheathed PbBi2223 tapes; coil; critical coupling distance; loss measurement; magnetic interaction; power cable; self-field AC losses; self-field loss per tape; stack-configuration; transport current; Assembly; Coils; Couplings; Critical current; Current measurement; Loss measurement; Magnetic separation; Power cables; Superconducting films; Superconducting magnets;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.783409
Filename :
783409
Link To Document :
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